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Advances in X-Ray Analysis

Volume 9 Proceedings of the Fourteenth Annual Conference on ...

$The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.$

جزئیات و درخواست

By Gavin R. Mallett, Marie Fay, William M. Mueller
Publisher: Springer Science & Business Media, 2013-11-21
Pages: 554
Language: en
ISBN_13:9781468476330
ISBN_10:1468476335
Subject: Science

Advances in X-Ray Analysis

Volume 7 Proceedings of the Twelfth Annual Conference on App...

جزئیات و درخواست

By William M. Mueller, Gavin R. Mallett, Marie Fay
Publisher: Springer, 1995-12-31
Pages: 662
Language: en
ISBN_10:0306381079
ISBN_13:9780306381072
Subject: Science

Advances in X-Ray Analysis

Volume 15

جزئیات و درخواست

By Charles Barrett
Publisher: Springer Science & Business Media, 2013-06-29
Pages: 582
Language: en
ISBN_13:9781461399667
ISBN_10:1461399661
Subject: Science

Advances in X-ray Analysis

Proceedings of the ... Annual Conference on Application of X...

جزئیات و درخواست

1989
Pages: 720
Language: en
OTHER:UCSC:32106020889934
Subject: X-rays

Advances in X-Ray Analysis

جزئیات و درخواست

By Gilfrich, I. C. Noyan
Publisher: Kluwer Academic Publishers, 1994
Pages: 792
Language: en
OTHER:UVA:X002481925
Subject: Medical

Advances in X-Ray Analysis

Volume 32

$The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).$

جزئیات و درخواست

By Charles S. Barrett, J.V. Gilfrich, Ron Jenkins, John C. Russ, J.W. Richardson Jr.
Publisher: Springer, 1989-06-01
Language: en
ISBN_10:0306432366
ISBN_13:9780306432361
Subject: Science

Advances in X-Ray Analysis

$The 35th Annual Denver Conference on Applications of X-Ray Analysis was held August 4-8, 1986, on the campus of the University of Denver. Since the previous year's conference had emphasized x-ray diffraction, this year the Plenary Session spotlighted x-ray fluorescence, with the title "Trends in XRF: A World Perspective," featuring renowned speakers from three major areas. XRF IN NORTH AMERICA, by Prof. D. E. Leydon, from Colorado State University, dealt specifically with developments in the fields of instrumentation, data treatment and applications in that part of the world. Prof. H. Ebel, from the Technical University of Vienna, discussed XRF IN EUROPE, concentrating on subjects including total reflection, improved fundamental parameters, quantitation without standards and imaging techniques. Tomoya Arai, of the Rigaku Industrial Corporation in Japan, in considering XRF IN THE FAR EAST, described the scientific activity in XRF and the applications thereof, primarily in Japan and China. These plenary lectures were interspersed with short discussions of PERSONAL OBSERVATIONS on the subject by the co-chairmen of the SeSSion, Ron Jenkins and myself. The intent of this session was to bring the audience up-to-date on the status of the field in various parts of the world, and to give some feeling concerning where it is likely to go in the immediate future. Hopefully, the publication of the written versions of those presentations in this volume will make the authors' thoughts available to many who could not be present at the conference.$

جزئیات و درخواست

By Charles S. Barrett
Publisher: Springer, 1999-03-05
Pages: 602
Language: en
ISBN_10:0306426900
ISBN_13:9780306426902
Subject: Science

Advances in X-Ray Analysis

Volume 26

$At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a "diffraction" year, and the theme is accuracy in powder diffraction. Instead of comprehensive cover age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results.$

جزئیات و درخواست

By Camden R. Hubbard
Publisher: Springer, 1983-06-01
Pages: 504
Language: en
OTHER:UVA:X001321191
Subject: Science

Advances in X-Ray Analysis

Volume 35B

جزئیات و درخواست

By C.S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, G.J. McCarthy
Publisher: Springer, 2012-11-21
Language: en
ISBN_10:1461365325
ISBN_13:9781461365327
Subject: Science

Advances in X-Ray Analysis

Volume 3 Proceedings of the Eighth Annual Conference on Appl...

$It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.$

جزئیات و درخواست

By William M. Mueller
Publisher: Springer, 2012-10-20
Pages: 376
Language: en
ISBN_10:1468474022
ISBN_13:9781468474022
Subject: Science

Advances in X-Ray Analysis

$The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sheraton Hotel, Colorado Springs, Colorado. The year 1995 was a special year for the X-ray analysis community, since it represented the 100th anniversary ofthe discovery ofX-rays by Wilhelm Roentgen. In commemoration of this event, the Plenary Session of the conference was entitled "THE ROENTGEN COMMEMORATIVE SESSION:1895-1995, "100 YEARS OF PROGRESS IN X-RA Y SCIENCE AND APPLICATIONS". It is interesting to note that while we celebrate 100 years ofthe use ofX-ray techniques in general, and about 80 years ofX-ray diffraction and spectroscopy in particular, the Denver X-ray Conference has been in place for about half ofthat time period! Like the X-ray methods it represents, the Denver Conference on Applications ofX-ray Analysis has grown and matured, has survived the rigors oftime, and today, provides the worlds' best annual forum for the exchange of experiences and developments in the various fields ofX-ray analysis. Imagine, when the Denver Conference started in 1951, there were no personal computer- in fact, there were no computers, period! There was no SEM, no microprobe, there were no Si(Li) detectors, no transistors, no synchrotrons, Hugo Rietveld was a child, and many members who regularly attend Denver Meetings today, weren't even born yet! As I write this foreword, a copy of volurne 1 of Advances in X-ray Analysis lays in front of me on my desk.$

جزئیات و درخواست

By John V. Gilfrich, I. Cev Noyan, Ron Jenkins, Ting C. Huang, Robert L. Snyder
Publisher: Springer, 2011-10-08
Pages: 908
Language: en
ISBN_10:1461553784
ISBN_13:9781461553786
Subject: Technology & Engineering

Advances in X-Ray Analysis

جزئیات و درخواست

By Charles S. Barrett
Publisher: Springer, 2013-03-26
Pages: 602
Language: en
ISBN_10:1461319366
ISBN_13:9781461319368
Subject: Science

Advances in X-Ray Analysis

Volume 37

$The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. From its modest beginnings in the early 1950's, the Denver X-Ray Conference has grown to become a major venue in the national scientific calendar, with an ever-growing overseas participation. The 1993 Conference was the latest of these annual gatherings of x-ray analysts, who come together to discuss topics of current interest in diffraction and fluorescence. As the size and flavor of the Conference has changed over the years, so too have the methods and techniques of x-ray materials analysis matured. Science is advanced by the creativity of a few and the mistakes of many. It is important, therefore, that from time to time we sit back and reflect on how we got where we are, and where we are likely to go next. There has been no greater impact on the field than the introduction of the digital computer, and the Plenary Session of the 1993 Conference, "Impact of the PC in X-Ray Analysis," was designed to reflect on the role of the personal computer in the metamorphosis of x-ray instrumentation and techniques. Since the personal computer is a creation of non-x-ray specialists, we, as a group, have simply attached ourselves to the coat-tails of experts and developers in the PC field and taken advantage of new computer systems as and when they were developed.$

جزئیات و درخواست

By John V. Gilfrich, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan
Publisher: Springer, 2012-11-05
Language: en
ISBN_10:1461360773
ISBN_13:9781461360773
Subject: Science

Advances in X-ray Analysis

$X-ray diffraction as a method of qualitative analysis for crystal line phases has been long accepted, and has had constant improvement in method and equipment. It has also been made more useful by the growth and improvement of the data collection available as reference standards. In recent years some attempts have been made to use the method to a greater extent by furnishing results on a quantitative basis. This has proved to be difficult because of the problem of comparing the relative intensities of the diffraction peaks from one phase to another. This year the initial session of invited papers focuses primarily on this problem. The subject is approached both by the use of internal comparison standards and by calculation of intensities. In addition, the identification of crystalline phases by X-ray diffraction of single crystals is discussed in an invited paper. This method, with its advantages of the use of very small samples, is becoming increasingly feasible because of the development of simple equipment and the avail ability of a growing data bank. Other X-ray diffraction developments discussed at the Conference include stress analysis, use of computers for searching the JCPDS powder diffraction file, texture analysis, and applications to specific fields. Spectroscopy topics covered at the conference included a discussion of methods of concentration of materials for fluorescence analysis, soft X-ray spectra, and equipment for fluorescence analysis.$

جزئیات و درخواست

By Howard McMurdie
Publisher: Springer, 2012-12-12
Pages: 604
Language: en
ISBN_10:1461399831
ISBN_13:9781461399834
Subject: Science

Advances in X-Ray Analysis

Proceedings of the Tenth Annual Conference on Application of...

جزئیات و درخواست

By William M. Mueller
Publisher: Springer, 2012-10-08
Pages: 564
Language: en
ISBN_10:1468476076
ISBN_13:9781468476071
Subject: Science

Advances in X-Ray Analysis

$In 1972 the Denver X-Ray Conference theme emphasized x-ray analysis in environmental~ biomedical~ and forensic applications. The first group of invited papers served to point out relationships between x-ray fluorescence, neutron activation~ and emission or ab sorption spectroscopy in these microanalytical applications. It was noticeable that detectabilities are now frequently expressed in nanograms or parts per billion rather than in micrograms or parts per million as a few years ago. Specific examples of x-ray appli cation to trace elements in water and air~ biomedical problems in mineralization of bone~ and forensic analysis of automobile paint chips followed in a second invited session. A number of contributed papers carried on the theme of applying x-ray analysis to social type problems. As might be expected~ x-ray fluorescence which has become so useful in the geological and metallurgical fields is al ready making its contribution to the social and ecological problem areas. Of course emphasis of a theme was not intended to discourage general diffraction or fluorescence papers~ nor did it. Elabora tion of energy dispersion instruments continues with computers to help display and interpret data. X-ray diffraction has begun ap plying strong flash x-ray sources to study dynamic situations such as shock Wave compression in solids. Electron spectroscopy, lattice parameter measurements, improved x-ray tubes and spectrometers all helped round out the useful three-day exchange on state-of-the-art x-ray analysis.$

جزئیات و درخواست

By L. Birks
Publisher: Springer, 2012-10-20
Language: en
ISBN_10:1461399734
ISBN_13:9781461399735
Subject: Science

Advances in X-Ray Analysis

$The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates emphasis between x-ray diffraction and x-ray fluorescence, and this being an odd year the emphasis was on diffraction. Thus the Plenary Session was slanted toward diffraction in general and thin film analysis in particular. The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. The session generated a great deal of interest, so Paul suggested that a workshop on thin films should be slated for the 1987 conference. A full day was devoted to the workshop, which was split into a half day on epitaxial thin films and the other half day on polycrystalline thin films. The workshop attendance indicated a great deal of interest in this topic, leading to this year's Plenary Session. The first two speakers of the Plenary Session (B. Tanner and K. Bowen) have been key throughout the thin film activities. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.$

جزئیات و درخواست

By Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins
Publisher: Springer, 2012-06-02
Pages: 704
Language: en
ISBN_10:146139998X
ISBN_13:9781461399988
Subject: Science

Advances in X-Ray Analysis

$The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.$

جزئیات و درخواست

By Charles S. Barrett, Paul K. Predecki
Publisher: Springer, 2011-11-01
Pages: 408
Language: en
ISBN_10:1461324726
ISBN_13:9781461324720
Subject: Science

Advances in X-Ray Analysis

جزئیات و درخواست

By Conference On Applications Of X-Ray Analysis
Publisher: Springer, 2011-12-14
Pages: 390
Language: en
ISBN_10:1461330971
ISBN_13:9781461330974
Subject: Science

Advances in X-Ray Analysis

جزئیات و درخواست

By Charles S. Barrett
Publisher: Springer, 2011-10-03
Pages: 542
Language: en
ISBN_10:1461283035
ISBN_13:9781461283034
Subject: Science

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