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تعداد نتایج: 355

Advanced X-ray Crystallography

$Computational Studies of Crystal Structure and Bonding, by Angelo Gavezzotti Cryo-Crystallography: Diffraction at Low Temperature and More, by Piero Macchi High-Pressure Crystallography, by Malcolm I. McMahon Chemical X-Ray Photodiffraction: Principles, Examples, and Perspectives, by Panče Naumov Powder Diffraction Crystallography of Molecular Solids, by Kenneth D. M. Harris$

جزئیات و درخواست

By Kari Rissanen
Publisher: Springer Science & Business Media, 2012-01-10
Pages: 190
Language: en
ISBN_13:9783642274077
ISBN_10:3642274072
Subject: Science

Understanding Single-Crystal X-Ray Crystallography

جزئیات و درخواست

By Dennis W. Bennett
Publisher: John Wiley & Sons, 2010-03-08
Pages: 826
Language: en
ISBN_13:9783527326778
ISBN_10:3527326774
Subject: Science

Advanced X-ray Techniques in Research and Industry

جزئیات و درخواست

By Ashok Kumar Singh
Publisher: IOS Press, 2005
Pages: 604
Language: en
ISBN_10:1586035371
ISBN_13:9781586035372
Subject: Medical

Principles of Protein X-ray Crystallography

جزئیات و درخواست

By Jan Drenth
Publisher: Springer Science & Business Media, 2013-03-09
Pages: 355
Language: en
ISBN_13:9781475730920
ISBN_10:1475730926
Subject: Science

Characterization of Crystal Growth Defects by X-Ray Methods

$This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.$

جزئیات و درخواست

By B.K. Tanner
Publisher: Springer Science & Business Media, 2013-04-17
Pages: 615
Language: en
ISBN_13:9781475711264
ISBN_10:1475711263
Subject: Science

Advanced X-ray Crystallography

جزئیات و درخواست

By Kari Rissanen
Publisher: Springer Science & Business Media, 2012-01-13
Pages: 190
Language: en
ISBN_13:9783642274060
ISBN_10:3642274064
Subject: Science

Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

$Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists$

جزئیات و درخواست

By Dong ZhiLi
Publisher: CRC Press, 2022-05-23
Pages: 219
Language: en
ISBN_13:9781000569902
ISBN_10:100056990X
Subject: Science

Computer Simulation Tools for X-ray Analysis

Scattering and Diffraction Methods

$This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. The main goal of this book is to break down the huge barrier of difficulties faced by beginners from many fields (Engineering, Physics, Chemistry, Biology, Medicine, Material Science, etc.) in using X-rays as an analytical tool in their research. Besides fundamental concepts, MatLab routines are provided, showing how to test and implement the concepts. The major difficult in analysing materials by X-ray techniques is that it strongly depends on simulation software. This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. It provides to a young student the knowledge that would take more than 20 years to acquire by working on X-rays and relying on the available textbooks. The scientific productivity worldwide is growing at a breakneck pace, demanding ever more dynamic approaches and synergies between different fields of knowledge. To master the fundamentals of X-ray physics means the opportunity of working at an infiniteness of fields, studying systems where the organizational understanding of matter at the atomic scale is necessary. Since the discovery of X radiation, its usage as investigative tool has always been under fast expansion afforded by instrumental advances and computational resources. Developments in medical and technological fields have, as one of the master girders, the feasibility of structural analysis offered by X-rays. One of the major difficulties faced by beginners in using this fantastic tool lies in the analysis of experimental data. There are only few cases where it is possible to extract structural information directly from experiments. In most cases, structure models and simulation of radiation-matter interaction processes are essential. The advent of intense radiation sources and rapid development of nanotechnology constantly creates challenges that seek solutions beyond those offered by standard X-ray techniques. Preparing new researchers for this scenario of rapid and drastic changes requires more than just teaching theories of physical phenomena. It also requires teaching of how to implement them in a simple and efficient manner. In this book, fundamental concepts in applied X-ray physics are demonstrated through available computer simulation tools. Using MatLab, more than eighty routines are developed for solving the proposed exercises, most of which can be directly used in experimental data analysis. Therefore, besides X-ray physics, this book offers a practical programming course in modern high-level language, with plenty of graphic and mathematical tools.$

جزئیات و درخواست

By Sérgio Luiz Morelhão
Publisher: Springer, 2015-10-05
Pages: 294
Language: en
ISBN_13:9783319195544
ISBN_10:3319195549
Subject: Science

Fifty Years of X-Ray Diffraction

Dedicated to the International Union of Crystallography on t...

$Fifty Years of X-Ray Diffraction$

جزئیات و درخواست

By P.P. Ewald
Publisher: Springer Science & Business Media, 2012-12-06
Pages: 735
Language: en
ISBN_13:9781461599616
ISBN_10:146159961X
Subject: Science

An Introduction to X-ray Crystallography

جزئیات و درخواست

By Michael M. Woolfson
Publisher: Cambridge University Press, 1997-01-13
Pages: 422
Language: en
ISBN_10:0521423597
ISBN_13:9780521423595
Subject: Medical

X-Ray Crystallography

جزئیات و درخواست

2016
Pages: 500
Language: en
ISBN_10:1680158368
ISBN_13:9781680158366
Subject: Crystallography

International Tables for Crystallography, Volume I

X-ray Absorption Spectroscopy and Related Techniques

جزئیات و درخواست

By Christopher Chantler, Bruce Bunker, Federico Boscherini
Publisher: John Wiley & Sons, 2024-08-19
Pages: 1090
Language: en
ISBN_13:9781119433941
ISBN_10:1119433940
Subject: Science

X-Ray and Neutron Dynamical Diffraction

Theory and Applications

$X-Ray and Neutron Dynamical Diffraction$

جزئیات و درخواست

By André Authier, Stefano Lagomarsino, Brian K. Tanner
Publisher: Springer Science & Business Media, 2012-12-06
Pages: 419
Language: en
ISBN_13:9781461558798
ISBN_10:1461558794
Subject: Science

X-Ray Diffraction Crystallography

Introduction, Examples and Solved Problems

$X-Ray Diffraction Crystallography$

جزئیات و درخواست

By Yoshio Waseda, Eiichiro Matsubara, Kozo Shinoda
2011-03-30
Pages: 324
Language: en
ISBN_10:3642166369
ISBN_13:9783642166365

High-Resolution X-Ray Scattering

From Thin Films to Lateral Nanostructures

$During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.$

جزئیات و درخواست

By Ullrich Pietsch, Vaclav Holy, Tilo Baumbach
Publisher: Springer Science & Business Media, 2013-03-09
Pages: 410
Language: en
ISBN_13:9781475740509
ISBN_10:1475740506
Subject: Technology & Engineering

X-ray Diffraction Methods

$X-ray Diffraction Methods$

جزئیات و درخواست

By E. W. Nuffield
1966
Pages: 432
Language: en
OTHER:STANFORD:36105031281384
Subject: Science

X-Ray and Neutron Structure Analysis in Materials Science

جزئیات و درخواست

By J. Hasek
Publisher: Springer Science & Business Media, 2012-12-06
Pages: 388
Language: en
ISBN_13:9781461307679
ISBN_10:1461307678
Subject: Science

Current Trends in X-Ray Crystallography

جزئیات و درخواست

By Annamalai Chandrasekaran
Publisher: BoD – Books on Demand, 2011-12-16
Pages: 452
Language: en
ISBN_13:9789533077543
ISBN_10:9533077549
Subject: Science

Structure Determination by X-Ray Crystallography

جزئیات و درخواست

By M. F. C. Ladd
Publisher: Springer Science & Business Media, 2012-12-06
Pages: 404
Language: en
ISBN_13:9781461579335
ISBN_10:1461579333
Subject: Science

Structure Determination by X-Ray Crystallography

جزئیات و درخواست

By Formerly Head of Chemical Physics Mark Ladd, Rex Palmer
Publisher: Springer, 2013-05-01
Pages: 794
Language: en
ISBN_10:1461439558
ISBN_13:9781461439554

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