Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

• Author(s): Ronald Donald Schrimpf, Dan M. Fleetwood,
• Publisher: World Scientific
• Pages: 339
• ISBN_10: 9812389407
  ISBN_13: 9789812389404
  
• Language: en
• Categories: Technology & Engineering / Electronics / General , Technology & Engineering / Electrical , Technology & Engineering / Electronics / Circuits / General , Technology & Engineering / Electronics / Semiconductors ,

Description:... This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.