Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy

Proceedings of a Workshop Held at the National Bureau of Standards, Gaithersburg, Maryland, October 1-3, 1975

• Author(s): Kurt F. J. Heinrich, Dale E. Newbury, Harvey Yakowitz,
• Publisher: U.S. Department of Commerce, National Bureau of Standards
• Pages: 164
• Language: en