Secondary Ion Mass Spectrometry

• Author(s): A. Benninghoven, Alfred Huber, H. W. Werner,
• Publisher: Wiley
• Pages: 1078
• ISBN_10: 0471918326
  ISBN_13: 9780471918325
  
• Language: en
• Categories: Science / Chemistry / Analytic , Science / Spectroscopy & Spectrum Analysis ,

Description:... The SIMS conference is recognized worldwide as a distinguished forum for those involved in the study and use of SIMS techniques, bringing together scientists working in fundamental research and instrument development, researchers using the SIMS method of analysis, service companies and instrument manufacturers.