Ionizing Radiation Effects in MOS Devices and Circuits

• Author(s): T. P. Ma, Paul V. Dressendorfer,
• Publisher: John Wiley & Sons
• Pages: 608
• ISBN_10: 047184893X
  ISBN_13: 9780471848936
  
• Language: en
• Categories: Technology & Engineering / Electronics / Semiconductors , Technology & Engineering / Electronics / General , Technology & Engineering / Electrical ,

Description:... The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.